Basler C12-5024-25M Fixed Focal Lens

USD 434.77

Premium 50mm C-mount fixed focal lens for 1.2″ sensors. Supports up to 25 MP resolution, 2.71 µm pixel pitch, and F2.4-F16 manual iris.

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Basler C12-5024-25M Fixed Focal Lens

Model Identifier C12-5024-25M
Official Part Number 2200001665
GTIN Standard NA

Technical Overview

Premium 50mm C-mount fixed focal lens for 1.2" sensors. Supports up to 25 MP resolution, 2.71 µm pixel pitch, and F2.4-F16 manual iris.

Key Features

  • Fixed focal length of 50.0 mm
  • Supports large sensor format up to 1.2 inches
  • Manual iris range of F2.4 to F16
  • Standard industry C-mount interface
  • Designed for 2.71 µm pixel pitch for high sharpness
  • Minimum working distance of 200 mm

Optimized for 25-megapixel resolution with a ultra-fine 2.71 µm pixel pitch compatibility for high-accuracy optical analysis.

Technical Specification Matrix

ParameterValue
Lens TypeFixed Focal Lens
Focal Length50 mm
MountC-mount
Sensor Format Compatibility1.2"
Resolution Capacity25 MP
Iris RangeF2.4 - F16
Iris Control TypeManual
Pixel Pitch Compatibility2.71 µm
Minimum Working Distance200 mm
Wavelength RangeVisible
Coaxial Illumination OptionNo
Warranty36 Months
Physical Weight (kg)0.2775
Dimensions L x W x H (cm)0 x 0 x 0

Industrial Applications

1. High-Resolution PCB Micro-Defect Inspection

Utilizes the 25 MP resolution capability and 2.71 µm pixel pitch compatibility to image dense circuit board layouts, allowing inspection software to locate micro-cracks and trace defects.

Problem Solved

Resolves the challenge of identifying microscopic solder bridges and trace defects on modern high-density PCBs.

25 MP Resolution2.71 µm Pixel PitchSolder Joint Inspection

2. Automated Dimensional Metrology

Applies the low distortion characteristics and 50 mm focal length of the lens to achieve accurate, high-contrast measurements on machined metallic parts from a working distance of 200 mm or greater.

Problem Solved

Eliminates measurement inaccuracies caused by optical distortion and vignetting across the edges of large 1.2" image sensors.

Low DistortionImage CircleMetrology

3. Semiconductor Wafer Alignment

Performs high-precision alignment verification of semiconductor wafers under visible spectrum light using a C-mount area scan camera.

Problem Solved

Ensures highly repeatable and crisp image capture of alignment fiducials at close working ranges.

C-mountVisible WavelengthFiducial Alignment
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